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EE 3330. PROBABILITY AND STATISTICAL METHODS. 3 Hours.

Probability, random variables, functions of random variables, moments, random signals, noise, stochastic models and power spectral density. Data and statistics. Random sampling. Statistical analysis, hypothesis testing, goodness of fit test, and regression. Response of LTI systems to random signals. Rigorous mathematical concepts will be tied to engineering system issues such as characterizing uncertainty due to measurement error, component and system tolerances, and noise sources such as device noise, quantization noise, communication channel noise, and thermal noise. Prerequisite: Must be in the professional EE program and C or better in each of the following: EE 2347 and EE 3316 (or concurrent enrollment).